The 2nd Annual IEEE Northeast Workshop on Circuits and Systems, 2004

Harmanani, H.; Marrouche, W.

The 2nd Annual IEEE Northeast Workshop on Circuits and Systems, 2004

Title: The 2nd Annual IEEE Northeast Workshop on Circuits and Systems, 2004;
Distributed control in testable high-level synthesis with low area and power overhead

Harmanani, H.; Marrouche, W.; SAS; 199490170; Computer Science and Mathematics; haidar.harmanani@lau.edu.lb; Lebanese American University

URI: http://hdl.handle.net/10725/5461

URL: http://ieeexplore.ieee.org/abstract/document/1359018/

DOI: http://dx.doi.org/10.1109/NEWCAS.2004.1359018

Abstract:

This work presents a method for distributed test control in coordination with testable data path allocation in high-level synthesis. The method aims at creating distributed test controllers for synthesized data paths with the aim of minimizing area and power consumption. The distributed controllers are designed to be small and mounted next to their corresponding test kernels. Thus, every test kernel in the datapath has its own test controller in addition to a relatively small controller that synchronizes the distributed controllers. The system has been implemented using C++ and favorable results are reported.

Citation:

Harmanani, H., & Marrouche, W. (2004, June). Distributed control in testable high-level synthesis with low area and power overhead. In Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on (pp. 65-68). IEEE.